Substituting Voas's Testability Measure for Musa's Fault Exposure Ratio
نویسندگان
چکیده
This paper analyzes the relationship between Voas s soft ware testability measure and Musa s fault exposure ratio K It has come to our attention that industrial users of Musa s model employ his published experimental value for K x for their projects instead of creating their own K estimate for the system whose reliability is being as sessed We provide a theoretical argument for how a slight modi cation to Voas s formulae for determining a predicted minimal fault size can provide a predicted average fault size The predicted average fault size can be used as a substitute for x and in our opinion is a more plausible choice for K
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